LaserSkill Ltd. has extensive experience in materials analysis. We can acquire and interpret data from a plethora of materials and surface characterization techniques, including – but not be limited to – the following:

• Scanning Electron Microscopy (SEM)
• Transmission Electron Microscopy (TEM)
• Energy Dispersive Spectrometry (EDS or EDAX)
• X-Ray Photoelectron Spectroscopy (XPS or ESCA)
• Optical Microscopy
• Confocal Microscopy
• Atomic Force Microscopy (AFM)
• Ultraviolet and Visible Spectroscopy (UV-VIS)
• Infrared Spectroscopy (IR)
• Raman Spectroscopy
• Rutherford Backscattering Spectrometry (RBS)
• Profilometry
• Ellipsometry

In case you have a sample to analyse or a property or behaviour to understand, just contact us by phone or e-mail!